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MAUD

Materials Analysis Using Diffraction

A Rietveld extended program to perform the combined analysis. It can be used to fit diffraction, fluorescence and reflectivity data using X-ray, neutron, TOF or electrons.

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Maud2

Maud schools

  • MAUD school update
  • MAUD 2018: materials characterisation by the combined analysis 26-30 November 2018, Trento, Italy.

Recent Posts

  • MAUD new version 1.993
  • Maud new version 2.992
  • MAUD new version 2.99
  • MAUD new version 2.98
  • MAUD new version 2.97

Tutorials/Examples

  • Maud tutorials
  • Video tutorials on YouTube
  • Rudy texture tutorials
  • Daniel formation pages

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