Official page for the Maud2015 school

The official page of the school in now online here.
The page is rapidly updating to have all necessary info and soon you’ll get the registration link there and you can start to send in your application.
If you want to be up to date with the latest features and get the maximum out from the program be sure to attend the school.

Here is a summary of the info anyway for reference. But for registration use the official web page.

International school: Trento, 19-23 October 2015
Title: Materials Characterisation by Combined Analysis

This international school will cover many aspects of the “Combined Analysis” by X-ray, neutron and electron scattering and X-ray fluorescence applied to material science, ranging from fundamental requirements to technically relevant industrial and academic applications. The combined analysis method has been developed over the years starting from the Rietveld method, extending it to most of the powder diffraction analyses and more recently incorporating, on the same idea, other techniques such as reflectivity, X-ray fluorescence and electron diffraction.
The aim is to give students as well as academic and non-academic researchers the necessary information and tools to be able to characterise their own materials and samples using the combined analysis method and the software MAUD. The characterisation involves obtaining information on the structure, microstructure, phase and elemental content, texture, stress in different kind of samples and structures including: thin films, bulk materials, anisotropic materials, poly-phased materials, nano-materials, etc.
Each type of analysis will be considered individually for the proper technique and then integrated into a combined analysis program. Some specific examples will be studied using X-ray, electron and neutron experimental data.
The objective is to bring together participants from various fields and to provide an opportunity to discuss individual interests and experience.
XRD, XRF and electron microscopy equipment available at the Dipartimento Ingegneria Industriale (DII) and Fondazione Bruno Kessler (FBK) will be used to demonstrate technical aspects and to support the theoretical and practical issues of this course. Several exercises will be performed with the MAUD and related software directly at the computer.
Fondazione Bruno Kessler, via Sommarive 18, 38123 Trento, Italy
Scientific Committee
Luca Lutterotti, DII, Università degli Studi di Trento (Luca)
Giancarlo Pepponi, FBK (Giancarlo)
Organising secretary
Communication and Events Service, University of Trento
You can download the program of the week here.
Juan Gomez Barreiro, Universidad de Salamanca, Salamanca, Spain
Philippe Boullay, CRISMAT-ENSICAEN, Caen, France
Daniel Chateigner, CRISMAT-ENSICAEN, Caen, France
Christophe Fontugne, INEL, Artenay, France
Stefano Gialanella, Università degli Studi di Trento, Trento, Italy
Matteo Leoni, Università degli Studi di Trento, Trento, Italy
Luca Lutterotti, Università degli Studi di Trento, Trento, Italy
Giancarlo Pepponi, FBK, Trento, Italy
Christina Streli, Vienna University of Technology, Vienna, Austria
Hans-Rudolf Wenk, Univ. California at Berkeley, USA
Lab and practical sessions
Mauro Bortolotti, DII, Università degli Studi di Trento (Mauro)
Gloria Ischia, DII, Università degli Studi di Trento (Gloria)
Victor Micheli, FMPS, FBK (Victor)
Registration fees 
Until September 20, 2015

  • Students: 250 €
  • All others: 400 €

After September 20, 2015

  • Students: 300 €
  • All others: 500 €

The link for registration and payment with information on hotels and venue is at the official school page.
In order to ensure and encourage individual interaction the number of participants will be limited to 40.
Registration fees include: admission and participation to the course, coffee breaks, lunches, reception and conference dinner, program and workshop abstracts
What is not included : hotel, transportation, other subsistence …
Necessary pre-requisites
Basic knowledge of crystallography and diffraction techniques
Good practice in the use of computers
Bring your laptop for the practical sessions (if it is not possible let us know)
Tools and resources
The MAUD program, or
The FPSM program, or
Lectures from previous edition and several examples/exercises:
The Crystallographic Open Database (COD):
Other resources on texture, tutorials and the Beartex program: and
Video tutorials on MAUD:
Do you wish to contribuite and sponsor the event?
Contact the organisers: Luca Lutterotti or Giancarlo Pepponi

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