8th Maud workshop

The 8th session of the workshop on “Combined analysis by X-ray and neutron scattering” will take place in Caen France from July 3rd to July 8th, 2017.
The training will cover many aspects of “Combined Analysis” by X-ray and neutron scattering, ranging from fundamental requirements to technically relevant industrial and academic applications : Diffraction technique – an overview, crystallography Texture Analysis, Residual Stress Analysis, Rietveld analysis, Reflectivity analysis, Phase analysis, Phase and line broadening analysis, The combined solution, XRD and XRF combined analysis, Electron Microscopy, using MAUD software…

8th MAUD Workshop 2017, Flyer

For more information about the workshop, please contact:

Daniel Chateigner Professor, CRISMAT Laboratory, Caen, France : scientific coordinator, Daniel Chateigner
Eric Berthier, THERMO FISHER SCIENTIFIC company, INEL brand : organization coordinator, Eric Berthier

2 Comments on “8th Maud workshop

    • There is also reflectivity, not only diffraction and finally X-ray fluorescence, that actually is not scattering. But diffraction and reflectivity are both scattering.
      So you will call a SAXS and SANS workshop scattering, but diffraction-reflectivity not. You may explain why?

      Finally, on the MAUD web site (see on the home page what Maud is capable of), you expect a MAUD workshop on SANS and SAXS?

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