MAUD school in Caen 2019 (Update 30/7/2019)

Update: the school was canceled. We are planning a new one for next year, mainly texture-stress based, and one in Trento beginning next year more about quantitative phase and chemical analyses (XRD+XRF+Raman?).

The 10th session of this workshop will take place in Caen France from July 1st to July 5th, 2019.

The training will cover many aspects of “Combined Analysis” by X-ray and neutron scattering, ranging from fundamental requirements to technically relevant industrial and academic applications : Diffraction technique – an overview, crystallography Texture Analysis, Residual Stress Analysis, Rietveld analysis, Reflectivity analysis, Phase analysis, Phase and line broadening analysis, The combined solution, XRD and XRF combined analysis, Electron Microscopy, Using MAUD software…

For more information about MAUD software, please visit the website:

For more information about the workshop, please contact us :

Daniel Chateigner Professor, CRISMAT Laboratory, Caen, France: scientific coordinator,

Eric Berthier, THERMO FISHER SCIENTIFIC company, INEL brand: organization coordinator,

Welcome to Caen

Eric BERTHIER, XRD Global World Sales Support, Sales engineer

INEL XRD instrumentation

Thermo Fisher Scientific


71 rue d’OrlĂ©ans, 45410 Artenay, France

T : +33 (0)2 38 80 45 45, M : +33 (0)6 35 81 76 63, F : +33 (0)2 38 80 08 14

M :

W : /

1 Comment on “MAUD school in Caen 2019 (Update 30/7/2019)

  1. I’m interested in using MAUD for fluorescence – and XRD data. Can MAUD be used for HPLC 2-D pattern plot to identify the morphology?

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